| Operational Status | ● Online | |||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Description |
Ellipsometer is in horizontal mode. Check with John Abrahams for Vertical mode. Software was upgraded 2-15-2019. If there are problems, please let me know as soon as possible. $37/hour for UMD $50/hour for Gov't- non-profit $91/hr - small commercial $160/hour for Large commercial.
Contact: John Abrahams at jabrah@umd.edu or (301) 405-6664 The J.A. Woollam M-2000D Spectroscopic Ellipsometer, 8" (190-1600nm) is a fully automated measurement tool that measures the optical properties of thin film semiconductor materials, specifically the complex refractive index or dielectric function. Additionally, the Woollam has mapping functionality and the incidence angle can be varied (typically, measurements are made from 60 to 85 |
|||||||||||||||
| Location | FabLab | 2300 KIM (Bldg #225) | |||||||||||||||
| Manufacturer |
J.A. Woollam M-2000D Link |
|||||||||||||||
| Staff Contact |
 John Abrahamsjabrah@umd.edu 301-405-5018 |
|||||||||||||||
| Rates | UMD $37/hr External Non-profit / University $50/hr Small Commercial / MTECH $91/hr Large Commercial $160/hr No Charge $0/hr |
|||||||||||||||
| Reservations |
|
|||||||||||||||
| Logs |
|
|||||||||||||||
| SOPs | ||||||||||||||||
| Manuals | You must have lab permissions to view the manuals. Please login to view manuals or contact the lab staff to obtain permissions. |
|||||||||||||||
| Recipes |
