| File Name | Date | File Size |
|---|---|---|
| .. | ||
| Determination of the optical parameters of a-Si:H thin films deposited by hot wire–chemical vapour deposition technique using transmission spectrum only | 2022-09-17 16:49 | - |
| Surface and thickness measurement of a transparent film using wavelength scanning interferometry | 2022-09-17 16:50 | - |
| AO.23.004477.pdf | 2022-08-20 23:32 | 1.0M |
| Thickness Measurement of a Transparent Thin Film Using Phase Change in White-Light Phase-Shift Interferometry.pdf | 2022-08-19 10:56 | 1.0M |
| ao-52-10-1998.pdf | 2022-09-17 16:46 | 1.7M |
| tie-29-refractive-index-and-dispersion-eng.pdf | 2022-08-20 23:23 | 1.8M |